Swift Ion Beam Analysis in Nanosciences. D. Jalabert, I. Vickridge, A. Chabli. Nanoscience and Nanotechnology Series (Ed.R. Baptist). John Wiley & Sons, 2017. ISBN: 978-1-84821-577-1.
Secondary Ion Mass Spectrometry. A. Benninghoven, Y. Nihei, R. Shimizu. John Wiley & Sons Canada, Ltd., 1994. ISBN: 978-0471942184.
Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy. D. Briggs, J.T. Grant (eds.). IM Publications, 2003. ISBN: 1-901019-047.
Introduction to Surface Chemistry and Catalysis, 2nd Edition. G.A. Somorjai, Y. Li. John Wiley & Sons, 2010. ISBN: 978-0-470-50823-7.
Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis. S.N. Magonov, M.H. Whangbo. Wiley-VCH, 1996. ISBN: 978-3527293131.
|